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JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Part No: E17W-H52

SKU: 67897705776

4.8
USD437.00 USD471.00

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Ships within 48 hours · Estimated delivery Jul 26 - Jul 31

Description

Part No: E17W-H52

This UNIT Instruments 1100-100039 is used working surplus

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This UNIT Instruments UFC-8161 is used working surplus

Estimated Packed Shipping Dimensions: L x W x H = 12” x 12” x 10” @ 5-6 lbs

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Part No: E17W-H52JEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
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